The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测
熔点标准物质熔点的测
的
成
原理。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测熔点标准物质熔点的测的成原理。
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