The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法
点标准物质点的装置的构
与工作原
。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法点标准物质点的装置的构与工作原。
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